Scanning Electron Microscope vs.Optical Microscope
Advantages
- Continuously variable magnification
- High resolution
- Depth of focus
- Elemental analysis attachments
Disadvantages
- Cost
- More knobs
- Vacuum
- Sample limitations
Scanning Electron Microscope(simplified drawing)
Signal Generation
In (Probe)
- Focused mono-energetic electron beam
Out (Signal)
- Imaging
Backscattered electrons
Secondary electrons
- Analysis
X-rays
Characteristic x-rays
Bremsstrahlung x-rays (background “noise”)
Auger electrons
Topographic contrast
SEM general info
SEM general info
- Mount the sample on the holder
- “Paint” the conductive path
SEM general info
- Load the sample into the SEM
SEM general info
- Vacuum pump 4 minutes
- Turn on filament current & accelerating voltage
- Fiddle with the knobs
Sample Prep
- Low C steel
- High C steel
- Unknown C steel
- Quenched from 1700 degF
- Anneal to 900 degF
- Furnace cooled from 1700 degF
High C (optical 600x)
High C (SEM 400x)
High C (SEM 3000x)
Low C vs High C (SEM 200x)
Low C(3000x vs 10000x)
中国电子显微镜学会微信群
加群方法:
长按扫描下方二维码,添加群管理员(微信号:13584972959),管理员将会拉你入群。
群规则:
1.群中不可以发广告。
2.防止机器人加入,进群后请主动打招呼。
3.申请时请说明所在公司及行业。